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Author:

Jian, Xianzhong (Jian, Xianzhong.) | Lv, Chen (Lv, Chen.) | Wang, Ruzhi (Wang, Ruzhi.) (Scholars:王如志)

Indexed by:

Scopus SCIE

Abstract:

The fixed-pattern noise (FPN) caused by nonuniform optoelectronic response limits the sensitivity of an infrared imaging system and severely reduces the image quality. Therefore, nonuniform correction of infrared images is very important. In this paper, we propose a deep filter neural network to solve the problems of network underfitting and complex training with convolutional neural network (CNN) applications in nonuniform correction. Our work is mainly based on the idea of deep learning, where the nonuniform image noise features are fully learned from a large number of simulated training images. The network is designed by introducing the filter and the subtraction structure. The background interference of the image is removed by the filter, so the learning model is gathered in the nonuniform noise. The subtraction structure is used to further reduce the input-to-output mapping range, which effectively simplifies the training process. The results from the test on infrared images shows that our algorithm is superior to the state-of-the-art algorithm in visual effects and quantitative measurements, providing a new method for deep learning in nonuniformity correction of single images.

Keyword:

subtraction structure filter nonuniformity correction deep learning

Author Community:

  • [ 1 ] [Jian, Xianzhong]Univ Shanghai Sci & Technol, Sch Opt Elect & Comp Engn, Shanghai 200093, Peoples R China
  • [ 2 ] [Lv, Chen]Univ Shanghai Sci & Technol, Sch Opt Elect & Comp Engn, Shanghai 200093, Peoples R China
  • [ 3 ] [Jian, Xianzhong]Shanghai Key Lab Modern Opt Syst, Shanghai 200093, Peoples R China
  • [ 4 ] [Lv, Chen]Shanghai Key Lab Modern Opt Syst, Shanghai 200093, Peoples R China
  • [ 5 ] [Wang, Ruzhi]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100020, Peoples R China

Reprint Author's Address:

  • [Jian, Xianzhong]Univ Shanghai Sci & Technol, Sch Opt Elect & Comp Engn, Shanghai 200093, Peoples R China;;[Jian, Xianzhong]Shanghai Key Lab Modern Opt Syst, Shanghai 200093, Peoples R China

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Source :

SYMMETRY-BASEL

Year: 2018

Issue: 11

Volume: 10

2 . 7 0 0

JCR@2022

ESI Discipline: Multidisciplinary;

ESI HC Threshold:337

Cited Count:

WoS CC Cited Count: 9

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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