The microstructure origin of large strain plastically deformed SiC nanowires - Details

Author：

Indexed by：

Scopus

Abstract：

Surprisingly　large　strain　plasticity　has　been　demonstrated　for　ceramic　SiC　nanowires　through　in-situ　deformation　experiments　near　room　temperature.　This　article　reports　a　detailed　electron　energy-loss　spectroscopy　(EELS)　study　of　deformation-induced　localized　plastic　zones　in　a　bent　SiC　nanowire.　Both　the　red　shift　of　the　plasmon　peak　and　the　characteristic　fine　structure　at　Si　L-edge　absorption　are　consistent　with　local　amorphisation　of　SiC.　The　recorded　C　K-edge　fine　structure　is　processed　to　remove　the　contribution　from　the　surface　amorphous　carbon　and　the　extracted　C　K-edge　fine　structure　has　no　characteristic　sp2-related　pre-edge　peak　and　hence　is　also　consistent　with　amorphous　SiC.　These　results　suggest　that　the　large　strain　plasticity　in　SiC　nanowires　is　enabled　by　crystalline-to-amorphous　transition.　©　2008　IOP　Publishing　Ltd.

Keyword：

Author Community：

[ 1 ] [Fu, X.]Laboratory of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
[ 2 ] [Fu, X.]Beijing National Centre for Electron Microscopy, China
[ 3 ] [Jiang, J.]Laboratory of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
[ 4 ] [Jiang, J.]Beijing National Centre for Electron Microscopy, China
[ 5 ] [Hu, X.]Laboratory of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
[ 6 ] [Hu, X.]Beijing National Centre for Electron Microscopy, China
[ 7 ] [Yuan, J.]Laboratory of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
[ 8 ] [Yuan, J.]Beijing National Centre for Electron Microscopy, China
[ 9 ] [Zhang, Y.]Beijing National Centre for Electron Microscopy, China
[ 10 ] [Zhang, Y.]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, 100022 Beijing, China
[ 11 ] [Han, X.]Beijing National Centre for Electron Microscopy, China
[ 12 ] [Han, X.]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, 100022 Beijing, China
[ 13 ] [Zhang, Z.]Beijing National Centre for Electron Microscopy, China
[ 14 ] [Zhang, Z.]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, 100022 Beijing, China

Reprint Author's Address：

[Fu, X.]Laboratory of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China

Email：

Show more details

Related Keywords：

Source ：

Journal of Physics: Conference Series

ISSN： 1742-6588

Year： 2008

Volume： 126

Cited Count：

WoS CC Cited Count：

SCOPUS Cited Count： 5

ESI Highly Cited Papers on the List： 0 Unfold All

WanFang Cited Count：

Chinese Cited Count：

30 Days PV： 0

Affiliated Colleges：

信息学部

材料与制造学部固体微结构与性能研究所

材料与制造学部材料科学与工程学院

Get Fulltext

DOI Library Discovery Baidu Scholar Search SCOPUS

Type
Departments

All Years Choose Year From to