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作者:

Yang, X.-H. (Yang, X.-H..) | Yang, S.-J. (Yang, S.-J..) | Dui, W.-Z. (Dui, W.-Z..) | Li, X.-Y. (Li, X.-Y..)

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摘要:

The intermetallic compound (IMC) at the interface of Sn3.0Ag0.5Cu/Cu solder joints under thermal cycling was observed and its mechanical properties were tested, the growth of intermetallic compound and the evolution of tensile strength of the joints were studied. The thermal cycling parameters such as holding time and minimum limit temperature were changed to make comparative tests. At the same time, the isothermal aging test and thermal cycling test were compared at the upper limit temperature of thermal cycle. The results show that with the increasing of cycle period, the equivalent thickness of the interface intermeallic compound(IMC) increases, and the lower the minimum limit temperature is, the faster the growth rate of the interface IMC is, and the tensile strength of the joints increases slightly and then decreases continuously. The growth rate of the intermetallic compound under isothermal aging condition is faster than that under thermal cycling condition with the same upper limit temperature holding time, and the interfacial atomic diffusion has been kept relatively fast in the absence of low temperature process. © 2018, Editorial Office of Transactions of Materials and Heat Treatment. All right reserved.

关键词:

Isothermal aging; Lead-free solder; Mechanical property; Microstructure; Thermal cycle

作者机构:

  • [ 1 ] [Yang, X.-H.]Instrumentation Analysis and Measurement Center, Fuzhou University, Fuzhou, 350002, China
  • [ 2 ] [Yang, S.-J.]Instrumentation Analysis and Measurement Center, Fuzhou University, Fuzhou, 350002, China
  • [ 3 ] [Dui, W.-Z.]Instrumentation Analysis and Measurement Center, Fuzhou University, Fuzhou, 350002, China
  • [ 4 ] [Li, X.-Y.]College of Materials Science and Engineering, Beijing University of Technology, Beijing, 100022, China

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来源 :

Transactions of Materials and Heat Treatment

ISSN: 1009-6264

年份: 2018

期: 4

卷: 39

页码: 145-150

被引次数:

WoS核心集被引频次: 0

SCOPUS被引频次: 1

ESI高被引论文在榜: 0 展开所有

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