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作者:

Liu, Zenghua (Liu, Zenghua.) (学者:刘增华) | Chen, Honglei (Chen, Honglei.) | Sun, Kunming (Sun, Kunming.) | He, Cunfu (He, Cunfu.) (学者:何存富) | Wu, Bin (Wu, Bin.) (学者:吴斌)

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Scopus SCIE

摘要:

Lamb waves defect detection technique is suitable to detect long-range defects and multi-defects in plates because of its attractive properties such as multi-modes, low attenuation, and multi-defect sensitivity. As the laser beams have the tiny size and noncontact property, in this paper a full non-contact laserbased Lamb waves phased array inspection technique was proposed for defect detection in an aluminum plate. A Q-switched Nd: YAG pulse laser generating Lamb waves and a continuous laser inspection system was used to inspect the out-of-plane displacements. The laser-generated Lamb waves have the broadband property and low temporal resolution that are not suitable for defects detection directly. So the continuous wavelet transform was used to extract narrowband signals from laser-generated Lamb wave and a linear mapping algorithm was adopted to compensate for the dispersion of the extracted narrowband signals. Two experiments were carried out to verify the applicability and effectiveness of the developed full non-contact laser-based Lamb waves phased array inspection technique. Two compact phased array imaging algorithms, the total focusing method and the sign coherence factor algorithm, were adopted to image the defects with processed signals. The experimental results accurately located the positions of the defects.

关键词:

Laser-based Lamb waves Dispersion compensation Continuous wavelet transform Phased array Sign coherence factor algorithm

作者机构:

  • [ 1 ] [Liu, Zenghua]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Chen, Honglei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Sun, Kunming]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 4 ] [He, Cunfu]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Wu, Bin]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

通讯作者信息:

  • 刘增华

    [Liu, Zenghua]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

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来源 :

JOURNAL OF VISUALIZATION

ISSN: 1343-8875

年份: 2018

期: 5

卷: 21

页码: 751-761

1 . 7 0 0

JCR@2022

ESI学科: COMPUTER SCIENCE;

ESI高被引阀值:161

JCR分区:4

被引次数:

WoS核心集被引频次: 16

SCOPUS被引频次: 19

ESI高被引论文在榜: 0 展开所有

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