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作者:

Deng, Wenjie (Deng, Wenjie.) | Chen, Yongfeng (Chen, Yongfeng.) | You, Congya (You, Congya.) | Liu, Beiyun (Liu, Beiyun.) | Yang, Yanhan (Yang, Yanhan.) | Shen, Gaoliang (Shen, Gaoliang.) | Li, Songyu (Li, Songyu.) | Sun, Ling (Sun, Ling.) | Zhang, Yongzhe (Zhang, Yongzhe.) (学者:张永哲) | Yan, Hui (Yan, Hui.)

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EI Scopus SCIE

摘要:

2D material-based photodetectors have demonstrated the great potential in future optoelectric applications and the compatibility with the traditional semiconductor technology. However, low detectivity and difficulty of large-scale fabrication still limit their application. Here, an ultrasensitive in-plane lateral graphene-MoS2 heterostructure is successfully constructed using one-step growth by chemical vapor deposition, which is suitable for large-scale fabrication. The Schottky junction is formed in the channel with the edge contact of graphene and MoS2. It displays good rectification characteristics with an on/off ratio up to 10(6). As a photodetector, it exhibits excellent detectivity with the specific detectivity D* up to 1.4 x 10(14) Jones and the responsivity of 1.1 x 10(5) A W-1, which benefit from strong absorption, the efficient separation of the photoexcited carriers, and quick charge transport in the Schottky junction device. Moreover, heterostructure photodetector array is demonstrated here which shows the large-scale fabrication capacity. All of these results prove the potential of 2D material-based junction devices for optoelectronic devices.

关键词:

chemical vapor deposition graphene lateral heterostructures MoS2 photodetectors

作者机构:

  • [ 1 ] [Deng, Wenjie]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 2 ] [Chen, Yongfeng]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 3 ] [You, Congya]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 4 ] [Liu, Beiyun]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 5 ] [Yang, Yanhan]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 6 ] [Shen, Gaoliang]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 7 ] [Li, Songyu]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 8 ] [Zhang, Yongzhe]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 9 ] [Yan, Hui]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 10 ] [Sun, Ling]Beijing Univ Technol, Beijing Guyue New Mat Res Inst, Beijing 100124, Peoples R China

通讯作者信息:

  • 张永哲

    [Zhang, Yongzhe]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China

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来源 :

ADVANCED ELECTRONIC MATERIALS

ISSN: 2199-160X

年份: 2018

期: 9

卷: 4

6 . 2 0 0

JCR@2022

ESI学科: MATERIALS SCIENCE;

ESI高被引阀值:131

JCR分区:1

被引次数:

WoS核心集被引频次: 50

SCOPUS被引频次: 41

ESI高被引论文在榜: 0 展开所有

万方被引频次:

中文被引频次:

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