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作者:

Zhou, KaiLing (Zhou, KaiLing.) | Wang, Hao (Wang, Hao.) (学者:汪浩) | Liu, Jingbing (Liu, Jingbing.) | Yan, Hui (Yan, Hui.)

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摘要:

The electrochromic WO3 devices normally suffer from the degradation of long-term performances since the accumulation of trapped ions in the host structure. In this study, we notice that the degradation of WO3 film consists of the decrease of bleaching state and the decay of coloration state, and the latter is the main factor of affecting the cyclic stability of the WO3 film. Here, it is discovered that the degradation of coloration state is due to the decrease of the charge density of inserted ions in the film during cycling process. By employing the open circuit potential (OCP) measurement, we find that the accumulation of trapped ions in WO3 film will cause the decay of OCP between the work electrode of WO3 film and counter electrode, which is the main reason of the decrease of inserted ions. This is because that the decay of OCP will weaken the electric field force used to drive ions into the film and shorten the duration time of ion insertion process. Consequently, the decline of charge density of the inserted ions will cause the decay of coloration state, which is the real mechanism of trapped ions eroding the cyclic life of the WO3 film.

关键词:

Open circuit potential Trapped ions Degradation Electrochromism

作者机构:

  • [ 1 ] [Zhou, KaiLing]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Wang, Hao]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Liu, Jingbing]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Yan, Hui]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China

通讯作者信息:

  • 汪浩

    [Wang, Hao]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China

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来源 :

INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE

ISSN: 1452-3981

年份: 2018

期: 8

卷: 13

页码: 7335-7346

1 . 5 0 0

JCR@2022

ESI学科: CHEMISTRY;

ESI高被引阀值:192

JCR分区:4

被引次数:

WoS核心集被引频次: 18

SCOPUS被引频次: 18

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