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作者:

Zhang, L. (Zhang, L..) | Cui, B. (Cui, B..) | Gao, X. (Gao, X..) | Li, M. (Li, M..) (学者:栗觅) | Guo, W. (Guo, W..) | Wang, J. (Wang, J..) | Wang, R. (Wang, R..) | Shen, G. (Shen, G..)

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摘要:

A new structure of transverse micro-stack semiconductor laser bars is put forward to improve the output optical power of semiconductor laser bars at low injection current, which can effectively lessen the thermal damage and catastrophic optical damage (COD). Micro-stack tunnel regeneration tri-active regions laser diode bars are fabricated. Experiments show that the output optical power is 79.3 W and slope efficiency exceeds 1.81 W/A under 50 A driving current, which is two times of that of the traditional single-active bars.

关键词:

Laser diode bars; Laser technique; Thermal characteristic; Transient temperature

作者机构:

  • [ 1 ] [Zhang, L.]Beijing Institute of Tracking and Telecommunication Technology, Beijing 100094, China
  • [ 2 ] [Cui, B.]Opto-Electronic Technology Laboratory, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Gao, X.]Beijing Institute of Tracking and Telecommunication Technology, Beijing 100094, China
  • [ 4 ] [Li, M.]Beijing Institute of Tracking and Telecommunication Technology, Beijing 100094, China
  • [ 5 ] [Guo, W.]Opto-Electronic Technology Laboratory, Beijing University of Technology, Beijing 100022, China
  • [ 6 ] [Wang, J.]Beijing Institute of Tracking and Telecommunication Technology, Beijing 100094, China
  • [ 7 ] [Wang, R.]Beijing Institute of Tracking and Telecommunication Technology, Beijing 100094, China
  • [ 8 ] [Shen, G.]Opto-Electronic Technology Laboratory, Beijing University of Technology, Beijing 100022, China

通讯作者信息:

  • [Zhang, L.]Beijing Institute of Tracking and Telecommunication Technology, Beijing 100094, China

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来源 :

Semiconductor Optoelectronics

ISSN: 1001-5868

年份: 2010

期: 1

卷: 31

页码: 20-22,100

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