The　electrical　property　in　arc　column　plays　a　fundamental　role　in　understanding,　controlling,　and　developing　arc　processes.　In　this　study,　a　novel　dual　active　probe　method　is　proposed　to　measure　the　arc　conductivity,　as　measured　by　the　voltage-to-current　ratio　(V-I　ratio),　and　study　its　electrical　property　distribution.　The　probes　were　partially　coated　except　for　their　tips　such　that　the　electrical　conductivity　can　be　accurately　tested　with　fine　resolution.　During　test,　the　two　probes　moved　into　the　arc　column　to　detect　the　V-I　ratio　of　selected　zone　between　the　probe　tips.　Since　the　speed　of　the　movement　is　relatively　slow,　the　moving　probes　are　expected　to　have　no　significant　interruption　to　the　arc.　The　effect　of　the　probe　rotation　angular　velocity　was　examined.　It　was　found　that　with　the　decrease　of　probe　angular　velocity,　the　instantaneous　V-I　ratio　of　the　arc　between　two　probes　firstly　decreases　and　then　tends　to　be　constant.　Analysis　suggests　that　the　dynamics　of　the　detection　circuit　is　responsible.　The　testing　current　applied　and　the　application　positions　(probe　tips),　as　parameters　of　the　detection　circuit,　were　then　analyzed　using　the　circuit　model.　This　novel　method　provides　an　effective　new　approach　to　study　fundamental　properties　of　welding.