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作者:

Zhao, Y. (Zhao, Y..) (学者:赵艳) | Zhang, W. (Zhang, W..) | Xie, H. (Xie, H..) | Huang, X. (Huang, X..) | Zhang, L. (Zhang, L..) | Jin, Z. (Jin, Z..) | Fu, Q. (Fu, Q..)

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Scopus PKU CSCD

摘要:

The effects of lateral structure parameters including emitter width, length and stripe number on small signal model parameters of SiGe HBTs were analyzed. Parameters Y for different sizes of Jazz 0.35 μm BiCMOS SiGe HBT were obtained, and the parameters of small signal model were correspondingly calculated. Results show that as the emitter width, length and stripe number increase, the resistance in the model decreases while the capacitance and transconductance increase. Moreover, the effect of SiGe HBTs lateral structure parameters on performance of the synthesized active inductor was analyzed. The results have a reference meaning for the selection of lateral structure parameters of active device used in synthesis of a active inductor. © 2016, Beijing University of Technology. All right reserved.

关键词:

Geometrical parameters; Parameters Y; SiGe hetero-junction bipolar transistor (SiGe HBT); Small signal model parameters

作者机构:

  • [ 1 ] [Zhao, Y.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Zhang, W.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Xie, H.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Huang, X.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 5 ] [Zhang, L.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 6 ] [Jin, Z.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 7 ] [Fu, Q.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China

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来源 :

Journal of Beijing University of Technology

ISSN: 0254-0037

年份: 2016

期: 4

卷: 42

页码: 508-512

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