Variation aware low power domino circuit performance statistical characterization analysis based on WNN - 文章详情页

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Scopus

摘要：

Using　Wavelet　Neural　Networks　(WNN),　low　power　domino　circuit　performance　statistical　characterization　is　investigated　in　this　paper.　The　proposed　model　successfully　estimates　the　nonlinear　changing　of　the　leakage　power,　the　active　power,　and　the　delay　of　the　different　fanin　low　power　domino　gates　with　the　dual　threshold　voltage　technique　(DVT),　the　multiplesupply　technique　(MST),　and　the　sleep　transistor　technique　(SST).　At　last,　the　precision　priority　of　estimating　system　is　obtained,　and　process　and　temperature　variationeffect　on　estimation　errors　is　analyzed.　©　2011　International　Information　Institute.

关键词：

Delay; Domino circuits; Low power; Neural networks

作者机构：

[ 1 ] [Wang, J.]VLSI and System Lab., Beijing University of Technology, Beijing, 100124, China
[ 2 ] [Gong, N.]Department of Computer Science and Engineering, SUNY at Buffalo, Buffalo, NY 14260, United States
[ 3 ] [Peng, X.]VLSI and System Lab., Beijing University of Technology, Beijing, 100124, China
[ 4 ] [Hou, L.]VLSI and System Lab., Beijing University of Technology, Beijing, 100124, China
[ 5 ] [Geng, S.]VLSI and System Lab., Beijing University of Technology, Beijing, 100124, China
[ 6 ] [Wu, W.]VLSI and System Lab., Beijing University of Technology, Beijing, 100124, China

通讯作者信息：

[Wang, J.]VLSI and System Lab., Beijing University of Technology, Beijing, 100124, China

电子邮件地址：

wangjinhui@bjut.edu.cn

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