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[期刊论文]

Quality-related fault monitoring and fault variable tracing based on bacth process

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Author:

Chang, P. (Chang, P..) | Wang, P. (Wang, P..) | Gao, X.-J. (Gao, X.-J..) (Scholars:高学金) | Unfold

Indexed by:

Scopus PKU CSCD

Abstract:

As the multi-way kernel entropy partial least squares (MKEPLS) method does not make full use of the higher-order statistics of the process data, which will lose the important information in the feature extraction, and result in degraded fault identification performance. To solve this problem, a novel method based on higher order statistics and multi-way kernel entropy partial least squares (HOS-MKEPLS) is proposed, in which the raw data space is projected into statistics space by calculating the higher order statistics of the data set, establishing the monitoring MKEPLS model, then adopting the contribution figure method on the trace of the fault variables. Finallay, the method is applied to an industrial penicillin fermentation process, and compared with the MKEPLS model. Results show that the method has a better monitoring performance and can detect and identify the fault. ©, 2015, Beijing University of Technology. All right reserved.

Keyword:

Batch process; Fault monitoring; Fault variable tracing; Higer order statistics; Multi-way kernel entropy partial least squares (MKEPLS)

Author Community:

  • [ 1 ] [Chang, P.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Wang, P.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Gao, X.-J.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Cheng, Z.]China Chemical Geology and Mine Bureau, Beijing, 100013, China

Reprint Author's Address:

  • 高学金

    [Gao, X.-J.]College of Electronic Information and Control Engineering, Beijing University of TechnologyChina

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2015

Issue: 5

Volume: 41

Page: 668-673

Cited Count:

WoS CC Cited Count: 0

30 Days PV: 0

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