The　preparation　of　80　um,　140　nm,　and　200　nm　La2Zr2O7　(LZO)　multilayers　on　biaxially　textured　Ni-5　at%　W　(Ni5W)　substrates　using　chemical　solution　deposition　(CSD)　was　studied.　The　performance　of　multilayers　was　studied　by　means　of　X-Ray　Diffraction　(XRD),　Electron　Back　Scattering　Diffraction　(EBSD),　and　Auger　Electron　Spectrometry　(AES).　The　as-grown　buffer　layers　exhibit　sharp　texture　with　texture　components　(0　degrees-10　degrees)　about　96.7%,　98.9%,　and　98.8%,　respectively.　The　full-width　at　half　maximum　(FWHM)　values　of　the　omega-scans　decreases　with　the　number　of　layers,　close　to　that　of　Ni5W　substrates.　The　films　exhibit　dense,　smooth,　crack-free　surface　with　a　roughness　Ra　3-5　nm,　and　sufficient　barrier　function　against　metal　ionic　diffusion　from　Ni5W　substrates　into　buffer　layers.　The　performance　of　LZO　multilayers　was　confirmed　by　YBa2Cu3O7-x.　(YBCO)　films　deposited　by　CSD　technology.