Illuminating quality assessment used by image collection - 文章详情页

作者：

Wang, T. (Wang, T..) (学者：王腾) | Chen, T. (Chen, T..) | Zhang, L. (Zhang, L..) | Zuo, T.-C. (Zuo, T.-C..) | Liu, S.-B. (Liu, S.-B..) (学者：刘世炳)

收录：

Scopus PKU CSCD

摘要：

In　the　micro-vision　measurement　system,　based　on　the　computer　micro-vision　and　the　micro-optics,　an　illuminating　quality　assessment　system　of　digital　images　for　improving　the　imaging　quality　and　the　precision　of　the　micro-image　measurement　was　built.　In　micro-vision　measurement　system,　applying　the　illuminating　quality　assessment　system,　the　best　illuminating　condition　was　got.

关键词：

Computer vision; Digital image; Illuminating quality; Measurement of MEMS; MEMS

作者机构：

[ 1 ] [Wang, T.]College of Laser Engineering, Beijing Polytechnic University, Beijing 100022, China
[ 2 ] [Chen, T.]College of Laser Engineering, Beijing Polytechnic University, Beijing 100022, China
[ 3 ] [Zhang, L.]College of Laser Engineering, Beijing Polytechnic University, Beijing 100022, China
[ 4 ] [Zuo, T.-C.]College of Laser Engineering, Beijing Polytechnic University, Beijing 100022, China
[ 5 ] [Liu, S.-B.]College of Laser Engineering, Beijing Polytechnic University, Beijing 100022, China

通讯作者信息：

王腾
[Wang, T.]College of Laser Engineering, Beijing Polytechnic University, Beijing 100022, China

电子邮件地址：

wangtong@emails.bjut.edu.cn

查看成果更多字段

成果类型
所属机构

所有年份指定年份从至