Electron　Backscattered　Scattering　Detection　(EBSD)　was　used　to　characterize　the　texture　of　La2Zr2O7　(LZO)　buffer　layers　prepared　by　chemical　solution　deposition　on　Ni-5at.%　W(Ni5W)　biaxially　textured　substrates.　We　investigated　the　texture　forming　process　of　LZO　films　with　different　cation　concentrations　of　the　precursor　solution.　In　this　paper,　the　texture　evolution　mainly　depends　on　the　film　thickness　and　on　the　grain　growth.　With　low　cation　concentrations　in　the　precursor　solution,　the　discontinuous　LZO　grains　do　not　completely　cover　the　Ni5W　substrates　and　exhibit　large　lattice　misorientation　with　respect　to　Ni5W　(defined　as　cube　orientation).　A　45　degrees　rotation　orientation　is　found　to　coexist　with　the　cube　orientation　and　is　mainly　transformed　by　the　cube　orientation　with　increasing　thickness.　The　interface　energy　minimization　may　play　a　dominant　role　in　texture　transformation.　(C)　2016　Elsevier　B.V.　All　rights　reserved.